The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 26, 2021
Filed:
Jul. 29, 2020
Beijing Institute of Technology, Beijing, CN;
Mingfeng Lu, Beijing, CN;
Jinmin Wu, Beijing, CN;
Kun Xiong, Beijing, CN;
Xianggen Xia, Beijing, CN;
Feng Zhang, Beijing, CN;
Ran Tao, Beijing, CN;
BEIJING INSTITUTE OF TECHNOLOGY, Beijing, CN;
Abstract
A method, device and electronic apparatus for estimating physical parameters are disclosed. The method includes: reading a Newton's rings fringe pattern obtained by performing an interferometric measurement on a unit to be measured; obtaining the number and length of first-direction signals of the Newton's rings fringe pattern; performing, for each of the first-direction signals, a discrete chirp Fourier transform (DCFT) on the first-direction signal based on each first chirp rate parameter within a range of the length of first-direction signals, to obtain a first magnitude spectrum of an intensity distribution signal in a DCFT domain; determining a first chirp rate parameter and a first frequency parameter corresponding to a first magnitude peak value based on the first magnitude spectrum; and estimating the physical parameters involved in the interferometric measurement at least according to the first chirp rate parameter and first frequency parameter corresponding to the first magnitude peak value. In this way, the physical parameters involved in the interferometric measurement can be estimated with high accuracy and stably.