This inventor holds 3 USPTO granted patents. Top assignees: Beijing Aerospace Institute for Metrology and Measurement Technology, Beijing Institute of Technology, Telenav Gmbh. Active years: 2014-2024.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:

Years Active: 2014-2024
Title: Kun Xiong: Innovator in Measurement Technology
Introduction
Kun Xiong is a prominent inventor based in Beijing, China. He has made significant contributions to the field of measurement technology, holding a total of 3 patents. His innovative approaches have advanced the accuracy and efficiency of various measurement techniques.
Latest Patents
Among his latest patents is a "Single star-based orientation method using dual-axis level sensor." This patent discloses a method that includes both a calibration process and an actual calculation process for orientation. Another notable patent is the "Method, device and electronic apparatus for estimating physical parameter by discrete chirp Fourier transform." This invention involves reading a Newton's rings fringe pattern obtained through interferometric measurement. It allows for the estimation of physical parameters with high accuracy by utilizing a discrete chirp Fourier transform on the first-direction signals of the fringe pattern.
Career Highlights
Kun Xiong has worked with esteemed organizations such as the Beijing Aerospace Institute for Metrology and Measurement Technology and the Beijing Institute of Technology. His experience in these institutions has further honed his skills and expertise in measurement technologies.
Collaborations
Throughout his career, Kun has collaborated with notable colleagues, including Yinxiao Miao and Chunxi Wang. These collaborations have contributed to the development of innovative solutions in their field.
Conclusion
Kun Xiong's work in measurement technology exemplifies the impact of innovation on scientific advancement. His patents and career achievements reflect his dedication to improving measurement techniques, making him a valuable contributor to the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile