The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 25, 2021

Filed:

Aug. 19, 2019
Applicant:

Beijing Institute of Technology, Beijing, CN;

Inventors:

Mingfeng Lu, Beijing, CN;

Jinmin Wu, Beijing, CN;

Ran Tao, Beijing, CN;

Zhen Guo, Beijing, CN;

Feng Zhang, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01B 11/24 (2006.01); G06T 5/00 (2006.01);
U.S. Cl.
CPC ...
G01B 11/2441 (2013.01); G01B 9/02043 (2013.01); G06T 5/002 (2013.01); G06T 2207/20056 (2013.01);
Abstract

A physical parameter estimating method, a physical parameter estimating device, and electronic apparatus are disclosed. The method includes: reading a Newton's rings fringe pattern obtained by performing an interferometric measurement on a unit to be measured; downsampling the Newton's rings fringe pattern to obtain a downsampled Newton's rings fringe pattern; calculating a magnitude spectrum of an intensity distribution signal of at least one first-direction pixel set in the downsampled Newton's rings fringe pattern under each fractional Fourier transform (FRFT) order in a searching range of FRFT orders, the first-direction direction pixel set including a line of pixels in a first direction, the first direction being one of a row direction and a column direction of the downsampled Newton's rings fringe pattern; determining a matched order of the intensity distribution signal according to the calculated magnitude spectrums; and estimating a physical parameter involved in the interferometric measurement according to at least the matched order. Therefore, physical parameters of the unit to be measured can be estimated with high accuracy even in presence of noise and obstacles in the fringe pattern.


Find Patent Forward Citations

Loading…