Taipei, Taiwan

Ming-Hsing Shen


Average Co-Inventor Count = 4.4

ph-index = 1


Location History:

  • Hsinchu, TW (2015)
  • Taipei, TW (2016)

Company Filing History:


Years Active: 2015-2016

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2 patents (USPTO):Explore Patents

Title: The Innovations of Ming-Hsing Shen

Introduction

Ming-Hsing Shen is a prominent inventor based in Taipei, Taiwan. He has made significant contributions to the field of optical measurement technology. With a total of 2 patents, his work focuses on enhancing measurement techniques and improving efficiency in various applications.

Latest Patents

Ming-Hsing Shen's latest patents include a multi-functioned optical measurement device and a system for computing surface reconstruction. The multi-functioned optical measurement device integrates conventional technologies such as white-light interferometry, confocal microscopy, and ellipsometry into a single device. This innovation allows for cost savings, on-line measuring, rapid monitoring, and reduced manufacturing time, while minimizing the risk of damage to objects during the manufacturing process. The second patent, a system for computing surface reconstruction, utilizes optical switching elements to analyze images of test objects before and after deformation. This system measures topography, in-plane and out-of-plane displacements, and surface strain distribution, thereby increasing measurement range and reducing complexity and error.

Career Highlights

Ming-Hsing Shen is affiliated with the National Applied Research Laboratories, where he continues to develop innovative solutions in optical measurement. His work has garnered attention for its practical applications and advancements in measurement technology.

Collaborations

Ming-Hsing Shen collaborates with notable colleagues such as Wei-Chung Wang and Chi-Hung Huang, contributing to a dynamic research environment that fosters innovation.

Conclusion

Ming-Hsing Shen's contributions to optical measurement technology exemplify the impact of innovative thinking in engineering. His patents reflect a commitment to improving measurement techniques and enhancing efficiency in various applications.

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