Aichi, Japan

Mikio Fujioka

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Jtekt Corporation. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Mikio Fujioka. Retrieved from https://idiyas.com/inventor/mikio-fujioka

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 9.0

ph-index = 1


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Mikio Fujioka - Innovator in Amorphous Carbon Film Technology

Introduction

Mikio Fujioka is a notable inventor based in Aichi, Japan. He has made significant contributions to the field of materials science, particularly in the development of methods for forming amorphous carbon films. His innovative approach has implications for various applications in technology and manufacturing.

Latest Patents

Mikio Fujioka holds a patent for an "Amorphous Carbon Film Forming Method and Device." This invention features a film forming furnace equipped with multiple workpiece fixtures that support plate-like workpieces arranged vertically. The design allows for efficient formation of amorphous carbon films at a low cost by controlling gas pressure and discharge stability.

Career Highlights

Fujioka is associated with Jtekt Corporation, where he has been instrumental in advancing technologies related to film formation. His work has not only enhanced the efficiency of production processes but has also contributed to the broader field of material engineering.

Collaborations

Mikio Fujioka has collaborated with notable colleagues, including Junji Ando and Naoyuki Sakai. Their combined expertise has fostered innovation and development in their respective fields.

Conclusion

Mikio Fujioka's contributions to the field of amorphous carbon film technology exemplify the impact of innovative thinking in engineering. His work continues to influence advancements in material science and manufacturing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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