Company Filing History:
Years Active: 2009-2012
Title: Michel Epsztein: Innovator in Nanoparticle Characterization
Introduction
Michel Epsztein is a notable inventor based in Lexington, MA (US). He has made significant contributions to the field of nanoparticle characterization, holding 2 patents that showcase his innovative approaches.
Latest Patents
His latest patents include methods and apparatus for statistical characterization of nanoparticles. These inventions involve distributing nanoparticles over a surface and determining their properties through automatic measurement of multiple particles. This method allows for the assessment of properties without the need to manipulate individual nanoparticles, enhancing efficiency and accuracy in research.
Career Highlights
Michel Epsztein has established himself as a key figure in his field, working at Fei Company. His expertise in statistical characterization has positioned him as a valuable asset in the advancement of nanoparticle research.
Collaborations
Throughout his career, Michel has collaborated with talented individuals such as Diane Stewart and Daniel A. Rosenthal. These partnerships have contributed to the development of innovative solutions in the realm of nanoparticle technology.
Conclusion
Michel Epsztein's work in nanoparticle characterization exemplifies the impact of innovation in scientific research. His patents and collaborations continue to influence advancements in this critical area of study.
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