The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 21, 2012
Filed:
May. 08, 2009
Applicants:
Diane K. Stewart, Ipswich, MA (US);
Daniel Rosenthal, Boxford, MA (US);
Michel Epsztein, Lexington, MA (US);
Inventors:
Diane K. Stewart, Ipswich, MA (US);
Daniel Rosenthal, Boxford, MA (US);
Michel Epsztein, Lexington, MA (US);
Assignee:
FEI Company, Hillsboro, OR (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/05 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and apparatus for determining statistical characteristics of nano-particles includes distributing the nano-particles over a surface and then determining properties of the nano-particles by automatic measurement of multiple particles or by a measurement that determines properties of multiple particles at one time, without manipulating individual nano-particles.