This inventor holds 3 USPTO granted patents and 1 published patent application, plus 1 CIPO patent and 1 EPO patent. Top assignee: Fei Comapny. Active years: 2014-2022.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2014-2022
Title: Michal Geryk: Innovator in Electron Microscopy
Introduction
Michal Geryk is a notable inventor based in Brno, Czech Republic. He has made significant contributions to the field of electron microscopy, holding a total of 3 patents. His work focuses on enhancing the functionality and efficiency of electron microscope systems.
Latest Patents
One of Michal Geryk's latest patents is a light guide assembly for an electron microscope. This invention describes an embodiment of an electron microscope system that includes an electron column pole piece and a light guide assembly that is operatively coupled together. The light guide assembly features one or more detectors and a mirror with a pressure limiting aperture, through which an electron beam from an electron source passes. The mirror is designed to reflect light and collect back scattered electrons and secondary electrons.
Another significant patent is the sample block holder. This assembly includes a sample tray, a base plate, a stage mount, and a calibration standard mounted onto the stage mount. The design incorporates three mating structures on the bottom of the base plate that align with corresponding structures on a stage mount attached to the sample stage of the scanning electron microscope (SEM). An optional contacting conductor provides electrical contact between the stage mount and the base plate, allowing charge generated on the sample by the electron beam to be effectively managed.
Career Highlights
Michal Geryk is currently employed at FEI Company, where he continues to innovate in the field of electron microscopy. His work has been instrumental in advancing the technology used in this area, contributing to more precise and efficient imaging techniques.
Collaborations
Throughout his career, Michal has collaborated with notable colleagues, including Matthew Barrett and Michael D. Smith. These collaborations have further enriched his work and contributed to the development of innovative solutions in electron microscopy.
Conclusion
In summary, Michal Geryk is a prominent inventor whose work in electron microscopy has led to several important patents. His contributions continue to shape the future of imaging technology in scientific research.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile