Michael Elad

Title: Michael Elad: Innovator in Spectroscopic Metrology

Introduction

Michael Elad is a prominent inventor based in Kiriat Tivon, Israel. He has made significant contributions to the field of spectroscopic metrology, holding a total of 6 patents. His innovative work focuses on enhancing the effectiveness of optical devices used in measurement and analysis.

Latest Patents

One of Michael Elad's latest patents involves a method for deconvolution to reduce the effective spot size of a spectroscopic optical metrology device. This technique allows for the reduction of the effective spot size through the deconvolution of a measurement spectra set acquired from a measurement target, combined with a training spectra set obtained from a similar training target. The measurement spectra set is acquired using sparse sampling of a grid scan, while the training spectra set is obtained from a grid scan of a training target. By deconvolving these spectra sets, an estimated spectrum for the measurement target can be produced, which reflects an effective spot size smaller than the actual size. This advancement enables the determination of various characteristics of the measurement target using the estimated spectrum.

Career Highlights

Michael Elad has worked with notable organizations, including the Technion Research & Development Foundation Limited and Nanometrics Inc. His experience in these companies has contributed to his expertise in the field of optical metrology and innovation.

Collaborations

Throughout his career, Michael has collaborated with talented individuals such as Amit Shachaf and Pedro Vagos. These collaborations have further enriched his work and contributed to the advancements in his field.

Conclusion

Michael Elad is a distinguished inventor whose work in spectroscopic metrology has led to significant innovations. His contributions continue to impact the field, showcasing the importance of research and development in advancing technology.