The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2015

Filed:

Oct. 23, 2013
Applicant:

Technion Research & Development Foundation Limited, Haifa, IL;

Inventors:

Michael Elad, Kiryat-Tivon, IL;

Joseph Shtok, Haifa, IL;

Michael Zibulevsky, Haifa, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 11/00 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
G06T 11/006 (2013.01); G06T 2211/424 (2013.01);
Abstract

A method of projection domain processing based on a local transform and shrinkage for use in reconstructing digital images from a set of projections, the method including providing a target image of a target object, providing projection data of the target object, producing filtered projection data by applying a sparsifying transform and a shrinkage function to the projection data, followed by an inverse of the sparsifying transform, producing a restored image by applying a reconstruction transform to the filtered projection data, comparing the restored image to the target image, and producing an optimized projection domain shrinkage function by adapting the shrinkage function to minimize differences between the restored image and the target image. Related apparatus and methods are also described.


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