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For the Inventor, By the Inventor

San Jose, CA, United States of America

Michael D Armacost

USPTO Granted Patents = 40 

Average Co-Inventor Count = 3.9

ph-index = 12

Forward Citations = 506(Granted Patents)


Location History:

  • Winooski, VT (US) (1997 - 1998)
  • Walkill, NY (US) (1998)
  • Wallkill, NY (US) (1995 - 2003)
  • Sunnyvale, CA (US) (2004)
  • San Jose, CA (US) (2004 - 2023)

Company Filing History:

goldMedal24 out of 164,108 
 
International Business Machines Corporation
 patents
silverMedal14 out of 13,684 
 
Applied Materials, Inc.
 patents
bronzeMedal2 out of 832,680 
Other
 patents

Years Active: 1995-2025

where 'Filed Patents' based on already Granted Patents

40 patents (USPTO):
1. 12314340 - Anomaly detection from aggregate statistics using neural networks (2025-05-27),
2. 11657122 - Anomaly detection from aggregate statistics using neural networks (2023-05-23),
3. 11378426 - System and method for monitoring sensor linearity as part of a production process (2022-07-05),
4. 10901407 - Semiconductor device search and classification (2021-01-26),
5. 10770321 - Process kit erosion and service life prediction (2020-09-08),
6. 10541169 - Method and system for balancing the electrostatic chucking force on a substrate (2020-01-21),
7. 10303812 - Topography prediction using system state information (2019-05-28),
8. 10177018 - Process kit erosion and service life prediction (2019-01-08),
9. 8143138 - Method for fabricating interconnect structures for semiconductor devices (2012-03-27),
10. 7758763 - Plasma for resist removal and facet control of underlying features (2010-07-20),
11. 7572734 - Etch depth control for dual damascene fabrication process (2009-08-11),
12. 7226853 - Method of forming a dual damascene structure utilizing a three layer hard mask structure (2007-06-05),
13. 7115534 - Dielectric materials to prevent photoresist poisoning (2006-10-03),
14. 6829056 - Monitoring dimensions of features at different locations in the processing of substrates (2004-12-07),
15. 6780753 - Airgap for semiconductor devices (2004-08-24),

Title: The Inventive Mind of Michael D Armacost

Introduction:

Michael D Armacost, a prolific inventor based in San Jose, CA, has left a remarkable impact in the world of technology with a total of 39 patents under his name.

Latest Patents:

1. Anomaly detection from aggregate statistics using neural networks: This patent describes a method to detect manufacturing anomalies by analyzing sensor statistics through a neural network system.

2. System and method for monitoring sensor linearity as part of a production process: This patent focuses on monitoring sensor health in manufacturing by evaluating sensor responses to set point changes.

Career Highlights:

Having worked at renowned companies such as IBM and Applied Materials, Inc., Michael has honed his skills and expertise in the technological domain, contributing significantly to innovation within these organizations.

Collaborations:

Throughout his career, Michael collaborated with talented individuals like Son Van Nguyen and Richard Stephan Wise, fostering a culture of teamwork and innovation to drive groundbreaking technological advancements.

Conclusion:

Michael D Armacost's dedication to pushing the boundaries of technology through his numerous patents and collaborations highlights his invaluable contributions to the world of innovation. His inventive spirit continues to inspire future generations in the tech industry.

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