IDiyas

For the Inventor, By the Inventor

Mainz, Germany

Michael Abraham

USPTO Granted Patents = 12

Average Co-Inventor Count = 2.2

ph-index = 7

Forward Citations = 123(Granted Patents)


Location History:

  • Mainz, 55129, DE (2001)
  • Mainz, DE (1995 - 2006)

Company Filing History:

goldMedal7 out of 9 
 
Nanophotonics Ag
 patents
silverMedal1 out of 3 
 
Imm, Institut Fur Mikrotechnik Gmbh
 patents
bronzeMedal1 out of 164,108 
 
International Business Machines Corporation
 patents
4. 1 out of 1 
 
Nanophotonics Ab
 patent
5. 1 out of 14,705 
 
Infineon Technologies Ag
 patents
6. 1 out of 5 
 
Recif Sa
 patents
7. 2 out of 832,680 
Other
 patents
where one patent can have more than one assignee

Years Active: 1995-2006

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12 patents (USPTO):Explore Patents
1. 7030401 - Modular substrate measurement system (2006-04-18),
2. 6954267 - Device for measuring surface defects (2005-10-11),
3. 6935201 - Measurement configuration including a vehicle and method for performing measurements with the measurement configuration at various locations (2005-08-30),
4. 6891609 - Measurement box with module for measuring wafer characteristics (2005-05-10),
5. 6798513 - Measuring module (2004-09-28),
6. 6734969 - Vacuum measurement device (2004-05-11),
7. 6420864 - Modular substrate measurement system (2002-07-16),
8. 6275291 - Micropolarimeter and ellipsometer (2001-08-14),
9. 6268915 - Micropolarimeter (2001-07-31),
10. 6091499 - Method and device for automatic relative adjustment of samples in (2000-07-18),
11. 5502567 - Micropolarimeter, microsensor system and method of characterizing thin (1996-03-26),
12. 5465611 - Sensor head for use in atomic force microscopy and method for its (1995-11-14),
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