Location History:
- Taoyuan County, TW (2013 - 2014)
- Taoyuan, TW (2020 - 2021)
- Hsinchu, TW (2023 - 2024)
Company Filing History:
6 out of 3,104 
2 out of 40,850 
Years Active: 2013-2025
Title: Innovations and Contributions of Inventor Meng-Jung Lee
Introduction
Meng-Jung Lee is a notable inventor based in Taoyuan, Taiwan. He has made significant contributions to the field of semiconductor technology, holding a total of 8 patents. His work focuses on methods and apparatuses that enhance the efficiency and reliability of electronic circuits.
Latest Patents
Among his latest patents is a method for evaluating non-uniform stress. This innovative approach involves measuring net wafer warpage across a wafer area due to thin film deposition. The process includes fitting a two-dimensional low-order polynomial to the wafer warpage measurements and subtracting this polynomial from the net wafer warpage across the wafer area. Another significant patent is a circuit check method and electronic apparatus applicable to a to-be-tested circuit. This method involves setting endpoint voltages of input interface ports, obtaining first and second node voltages, and performing a static check on the circuit.
Career Highlights
Meng-Jung Lee has worked with prominent companies in the semiconductor industry, including Realtek Semiconductor Inc. and Taiwan Semiconductor Manufacturing Company Limited. His experience in these organizations has allowed him to develop and refine his innovative ideas.
Collaborations
Throughout his career, Meng-Jung Lee has collaborated with talented individuals such as Yu-Lan Lo and Shu-Yi Kao. These partnerships have contributed to the advancement of his projects and patents.
Conclusion
Meng-Jung Lee's contributions to the field of semiconductor technology are noteworthy. His innovative patents and collaborations reflect his commitment to advancing electronic circuit technology. His work continues to influence the industry and inspire future innovations.