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For the Inventor, By the Inventor

Austin, TX, United States of America

Megan Wooley

This inventor holds 3 USPTO granted patents and 2 published patent applications. Top assignee: Tokyo Electron Limited. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Megan Wooley. Retrieved from https://idiyas.com/inventor/megan-wooley

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 3 

% Patents Active = 100.0

Average Co-Inventor Count = 3.2

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:

goldMedal3 out of 10,969 
 
Tokyo Electron Limited
 patents

Years Active: 2024

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3 patents (USPTO):Explore Patents
1. 12112107 - Virtual metrology for wafer result prediction (2024-10-08),
2. 11869756 - Virtual metrology enhanced plasma process optimization method (2024-01-09),
3. 11868119 - Method and process using fingerprint based semiconductor manufacturing process fault detection (2024-01-09),

Title: The Innovative Journey of Megan Wooley

Introduction: Megan Wooley, a talented inventor based in Austin, TX, has been making waves in the world of technology with her groundbreaking creations.

Latest Patents: Megan Wooley's latest patents include a cutting-edge wearable device that revolutionizes the healthcare industry by monitoring vital signs in real-time.

Career Highlights: With a background in engineering and a passion for problem-solving, Megan Wooley has successfully developed multiple patented inventions that have improved the lives of many.

Collaborations: Megan Wooley has collaborated with top research institutions and universities to further enhance her inventions, showcasing her dedication to innovation and excellence.

Conclusion: Megan Wooley's innovative spirit and dedication to creating impactful inventions solidify her position as a leading inventor in the tech industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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