Medona B Denton

Title: Medona B Denton: Innovator in Wafer Measurement Technologies

Introduction

Medona B Denton is a prominent inventor based in Tucson, AZ (US). She has made significant contributions to the field of wafer measurement technologies, holding a total of 5 patents. Her innovative approaches have advanced the understanding and control of substrate processing conditions.

Latest Patents

Among her latest patents is a method of wafer band-edge measurement using transmission spectroscopy. This process allows for the determination of a substrate's temperature by analyzing the band-edge characteristics of the wafer. By passing light through the substrate, this in-situ method can be utilized as a feedback control in conjunction with a variable temperature substrate holder. This technology enhances the accuracy of processing conditions by measuring temperature variations across the substrate through multiple measurement sites. Another notable patent is the radial and azimuthal non-resonant open-tubular optoacoustic cell. This innovative cell operates without windows, effectively eliminating window background interference. It is constructed from an elongated tube made of conducting material, which is perforated along its center to form a capacitor microphone.

Career Highlights

Throughout her career, Medona has worked with esteemed organizations, including the United States Navy and Tokyo Electron Limited. Her work has significantly impacted the field of wafer measurement and processing technologies.

Collaborations

Medona has collaborated with notable individuals such as David L Windsor and David R Heine, contributing to her innovative projects and advancements in technology.

Conclusion

Medona B Denton is a trailblazer in the realm of wafer measurement technologies, with a strong portfolio of patents that reflect her expertise and innovative spirit. Her contributions continue to influence the industry and pave the way for future advancements.