Jaipur, India

Mayank Parasrampuria


Average Co-Inventor Count = 3.4

ph-index = 2

Forward Citations = 12(Granted Patents)


Company Filing History:


Years Active: 2017

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2 patents (USPTO):Explore Patents

Title: Innovations by Mayank Parasrampuria

Introduction

Mayank Parasrampuria is an accomplished inventor based in Jaipur, India. He has made significant contributions to the field of integrated circuits, holding two patents that showcase his innovative spirit and technical expertise.

Latest Patents

One of his latest patents is the LBIST debug controller. This integrated circuit (IC) features a logic built-in self-test (LBIST) system that includes scan chains. The scan chains receive a clock signal and test pattern signals, generating scan out signals. A debug controller receives these scan out signals and shifts a set of them to a joint test action group (JTAG) controller. The debug controller maintains a dynamic count indicative of the number of debug shift operations performed and compares this count with a final count. If the dynamic count is less than the final count, the debug controller performs a second debug shift operation, facilitating the determination of a fault location in the IC.

Another notable patent is the scan wrapper circuit for integrated circuits. This IC operates in both internal and external testing modes (INTEST and EXTEST) and includes first and second partitions with a functional path between them. The first partition consists of a first scan chain, a first multiplexer, and a first flip-flop, while the second partition includes a second flip-flop and a second scan chain. The first scan chain generates an EXTEST vector initialization signal based on an EXTEST scan input signal. The first multiplexer receives both an INTEST vector initialization signal and the EXTEST vector initialization signal, generating a scan input signal. The first flip-flop produces a first output signal based on this scan input signal, leading to a second output signal through the functional path. The second flip-flop generates a third output signal based on the second output signal, and the second scan chain receives this third output signal to generate a test output signal.

Career Highlights

Mayank has worked with prominent companies in the semiconductor industry, including Freescale Semiconductor, Inc. and NXP USA, Inc. His experience in these organizations has contributed to his development as an inventor and innovator in integrated circuit technology.

Collaborations

Throughout his career, Mayank has collaborated with talented individuals such as Sagar Kataria and Anurag Jindal. These collaborations have likely enriched his work and fostered a creative environment for innovation.

Conclusion

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