This inventor holds 1 USPTO granted patent. Top assignee: Kla-Tencor Technologies Corporation. Active years: 2009.
Company Filing History:
Years Active: 2009
Title: Mathew H. Lent: Innovator in Charged Particle Microscopy
Introduction
Mathew H. Lent is a notable inventor based in Livermore, California. He has made significant contributions to the field of microscopy, particularly through his innovative work in charged particle microscopy.
Latest Patents
Lent holds a patent for a method titled "Charged particle microscopy using super resolution." This invention focuses on improving throughput in the review of images obtained from a charged particle beam microscopy tool. The patent showcases his expertise in enhancing imaging techniques in scientific research.
Career Highlights
Mathew H. Lent is associated with KLA-Tencor Technologies Corporation, a leading company in the field of semiconductor manufacturing and process control. His work at KLA-Tencor has allowed him to apply his innovative ideas in a practical setting, contributing to advancements in technology.
Collaborations
Throughout his career, Lent has collaborated with talented individuals such as Mehran Nasser-Ghodsi and Kenneth Krzeczowski. These collaborations have fostered a creative environment that encourages the development of groundbreaking technologies.
Conclusion
Mathew H. Lent's contributions to charged particle microscopy exemplify his dedication to innovation in the field. His patent and work at KLA-Tencor Technologies Corporation highlight his role as a key figure in advancing microscopy techniques.