Masayoshi Nomura

This inventor holds 19 USPTO granted patents, primarily in Semiconductor Memory. Top assignees: Micron Technology Incorporated, Texas Instruments Corporation. Active years: 1989-2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Masayoshi Nomura. Retrieved from https://idiyas.com/inventor/masayoshi-nomura

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 19

% Patents Active = 94.7

Average Co-Inventor Count = 2.5

ph-index = 6

Forward Citations = 100(Granted Patents)

Location History:

Tsuchiura, JP (1989)
Sanuki-machi, JP (2010)
Ryugasaki, JP (1994 - 2015)
Ibaraki, JP (1995 - 2015)

Company Filing History:

15 out of 39,253

Micron Technology Incorporated

patents

4 out of 29,901

Texas Instruments Corporation

patents

Years Active: 1989-2015

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Areas of Expertise:

Power Saving Memory

JTAG Self-Repair

Defect Testing

Integrated Circuit

Redundant Memory Cells

Dynamic Memory Elements

Voltage Supply Boost

FIFO Memory

19 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 9082471 - Power saving memory apparatus, systems, and methods (2015-07-14),

2. 9042195 - Control of inputs to a memory device (2015-05-26),

3. 8737155 - Power saving memory apparatus, systems, and methods (2014-05-27),

4. 8736291 - Methods for defect testing of externally accessible integrated circuit interconnects (2014-05-27),

5. 8611168 - Control of inputs to a memory device (2013-12-17),

6. 8325552 - Control of inputs to a memory device (2012-12-04),

7. 8230274 - JTAG controlled self-repair after packaging (2012-07-24),

8. 8122304 - JTAG controlled self-repair after packaging (2012-02-21),

9. 8014222 - Control of inputs to a memory device (2011-09-06),

10. 8004920 - Power saving memory apparatus, systems, and methods (2011-08-23),

11. 7990163 - Systems and methods for defect testing of externally accessible integrated circuit interconnects (2011-08-02),

12. 7831870 - JTAG controlled self-repair after packaging (2010-11-09),

13. 7733731 - Control of inputs to a memory device (2010-06-08),

14. 7721163 - JTAG controlled self-repair after packaging (2010-05-18),

15. 7612574 - Systems and methods for defect testing of externally accessible integrated circuit interconnects (2009-11-03),

Title: The Innovative Contributions of Masayoshi Nomura

Introduction: Masayoshi Nomura, located in Ryugasaki, Japan, is a notable inventor with an impressive portfolio of 19 patents. His work primarily focuses on advancements in memory devices, showcasing a commitment to enhancing power efficiency and control within electronic systems.

Latest Patents: Nomura's latest innovations include a "Power Saving Memory Apparatus, Systems, and Methods," which features a voltage generator designed to optimize power usage by applying voltage selectively to memory cell access lines. This allows for improved energy efficiency during non-active periods and refresh operations of memory devices. Another significant patent, "Control of Inputs to a Memory Device," addresses command hazards in memory devices by utilizing control interface logic. During the drowsy mode, this innovation enables the self-refresh signal to effectively disable external inputs, enhancing overall device performance and reliability.

Career Highlights: Throughout his career, Masayoshi Nomura has contributed to esteemed companies, including Micron Technology Incorporated and Texas Instruments Corporation. His role in these organizations has allowed him to develop and refine his groundbreaking technologies, significantly impacting the field of memory devices.

Collaborations: Nomura has worked alongside talented colleagues, including Yutaka Ito and Keiichiro Abe. These collaborations have played a crucial role in fostering innovation and advancing memory technology through shared expertise and vision.

Conclusion: Masayoshi Nomura stands out as a prominent inventor in the realm of memory technology. His contributions through patents not only demonstrate his innovative spirit but also highlight the importance of collaboration in driving technological advancements. As he continues to develop new solutions, the impact of his work will undoubtedly resonate within the industry for years to come.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]