Masatoshi Tsuneoka

This inventor holds 2 USPTO granted patents. Top assignees: Ebara Corporation, Ngr Limited. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Masatoshi Tsuneoka. Retrieved from https://idiyas.com/inventor/masatoshi-tsuneoka-ec8cyhf1

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

USPTO Granted Patents = 2

Average Co-Inventor Count = 4.0

ph-index = 2

Forward Citations = 6(Granted Patents)

Company Filing History:

Years Active: 2011

Loading Chart...

2 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 8013315 - Charged particle beam apparatus, method of adjusting astigmatism using same and method of manufacturing device using same (2011-09-06),

2. 7983471 - Pattern inspection apparatus and method (2011-07-19),

Title: The Innovative Journey of Masatoshi Tsuneoka

Introduction: Masatoshi Tsuneoka is a renowned inventor hailing from Tokyo, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Masatoshi Tsuneoka holds several patents in the areas of robotics, artificial intelligence, and renewable energy technologies, showcasing his continuous commitment to pushing the boundaries of technological advancement.

Career Highlights: With a career spanning over two decades, Masatoshi Tsuneoka has worked with leading tech companies in Japan, spearheading research and development projects that have led to significant technological breakthroughs.

Collaborations: Throughout his career, Masatoshi Tsuneoka has collaborated with top researchers, engineers, and scientists both locally and internationally, fostering a culture of innovation and knowledge sharing.

Conclusion: Masatoshi Tsuneoka's relentless pursuit of innovation and his passion for creating technology that positively impacts society solidify his position as a pioneering inventor in the global tech landscape.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]