Fujisawa, Japan

Masatoshi Itoh

This inventor holds 5 USPTO granted patents. Top assignees: Wintest Corporation, International Business Machines Corporation. Active years: 1996-2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Masatoshi Itoh. Retrieved from https://idiyas.com/inventor/masatoshi-itoh-x1m5d5uz

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 20.0

Average Co-Inventor Count = 3.3

ph-index = 3

Forward Citations = 43(Granted Patents)


Location History:

  • Kanagawa Prefecture, JP (2003)
  • Kanagawa, JP (2005)
  • Fujisawa, JP (1996 - 2007)

Company Filing History:


Years Active: 1996-2007

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5 patents (USPTO):Explore Patents

Title: Masatoshi Itoh: Display Inspection and Active-Matrix Technology

Introduction

Masatoshi Itoh is an inventor associated with Fujisawa, Japan. His patent work includes methods and devices for inspecting display panels and active-matrix substrates. He is credited with 5 patents.

Latest Patents

One of Itoh’s latest patents, “Inspection Method and Inspection Device for Display Device and Active Matrix Substrate Used for Display Device,” describes a system for identifying defective pixels. The device measures current through inspection interconnects, corrects for current present when all pixels are off, and evaluates each pixel as it is switched on.

Another patent, “Apparatus and Method for Inspecting Picture Elements of an Active Matrix Type Display Board,” addresses inspection of LCD and electroluminescent display arrays. Its method subtracts correction data gathered while gate lines are unselected from measurements taken during pixel charging, helping reduce measurement irregularities and improve inspection accuracy.

Career Highlights

Itoh’s listed company affiliations include Wintest Corporation and International Business Machines Corporation. His patent contributions focus on improving the reliability and precision of display-pixel inspection.

Collaborations

His listed coworkers include Makoto Ookuma and Shoji Nara. Their shared professional context is reflected in the display-inspection inventions described above.

Conclusion

Masatoshi Itoh’s patent portfolio highlights practical approaches to detecting pixel defects and improving the accuracy of active-matrix display inspection.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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