The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 14, 2003

Filed:

Jul. 03, 2001
Applicant:
Inventors:

Shouji Nara, Kanagawa Prefecture, JP;

Masatoshi Itoh, Kanagawa Prefecture, JP;

Makoto Ookuma, Kanagawa Prefecture, JP;

Tomoharu Innami, Kanagawa Prefecture, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G 3/10 ;
U.S. Cl.
CPC ...
G09G 3/10 ;
Abstract

It is an object of the present invention to provide an apparatus and method for evaluating an organic EL display, with which there is a simple drive circuit used for testing an organic EL display , evaluation of high reliability can be achieved, and an evaluation of the organic EL display itself is performed prior to the installation of finished product drive circuits to the organic EL display , which makes it possible to suppress the decrease in yield caused by dealing with defective products due to the evaluation results. It was noticed that if the drive (testing) of a pixel is performed during the discharge of the previous pixel after the supply of drive current to that previous pixel , and if the difference between the drive current and discharge current values of the organic EL pixel of the pixel is under a specific level, then it is possible to decide that the pixels constituted by the various organic EL elements are operating normally, and the present invention is characterized in that pixel defects are detected by detecting the difference between drive current and discharge current values for every pixel constituted by an organic EL element


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