The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 10, 2005
Filed:
Apr. 22, 2002
Shouji Nara, Kanagawa, JP;
Masatoshi Itoh, Kanagawa, JP;
Makoto Ookuma, Kanagawa, JP;
Wintest Corporation, , JP;
Abstract
The present invention provides a picture element inspecting apparatus and method for an active matrix type display that is constituted by an LCD array device or an EL array device, which is capable of canceling the irregularities in source switches, the noise caused by device driving signals, and the irregularities in devices in the measurement apparatus, and enhancing the accuracy of a picture element inspection. The present invention is based on the finding that irregularities in the direction of the source linescan be canceled by performing, in addition to a charging step and first sensing step that are realized by the charging and discharging of picture elements, a second sensing step in a state where gate lines are not selected, and subtracting correction picture element data thus obtained, and is characterized in that a subtraction operation is performed on effective picture element data obtained by electrically charging picture elements, and correction picture element data obtained in a state where gate linesof picture elementsare not selected, and the quality of the picture elementsis determined based on the subtraction output.