Masaru Ichihara is a prominent inventor based in Ashiya, Japan. He has made significant contributions to the field of X-ray inspection technology, holding a total of 5 patents. His work has been instrumental in advancing methods and devices used for inspecting various objects through X-ray imaging.

Latest Patents

Ichihara's latest patents include an X-ray inspection apparatus and an X-ray inspection method. The X-ray inspection device is designed to hold an object to be inspected while irradiating it with X-rays from an X-ray irradiation device. It utilizes a swinging device that allows for tilting the object at arbitrary angles and directions. The device images the X-ray that passes through the object and extracts data from the desired cross-section in a control device. Another notable patent is the component mounting control method, which involves a mounting system where a chip component is mounted on paste solder applied to a board. This method inspects the mounting state and confirms the presence of a chip component, transmitting the confirmation result to a controller for further action.

Career Highlights

Masaru Ichihara has been associated with Matsushita Electric Industrial Co., Ltd., where he has contributed to various innovative projects. His expertise in X-ray technology has positioned him as a key figure in the development of advanced inspection systems.

Collaborations

Ichihara has worked alongside notable colleagues such as Shinji Yoshino and Hiroyuki Inoue. Their collaborative efforts have further enhanced the quality and effectiveness of the technologies developed at their company.

Conclusion

Masaru Ichihara's contributions to X-ray inspection technology reflect his dedication to innovation and excellence. His patents and collaborative work continue to influence the field, showcasing the importance of advancements in inspection methods.

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