The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2006
Filed:
Aug. 23, 2004
Masaru Ichihara, Ashiya, JP;
Shinji Yoshino, Nishinomiya, JP;
Hiroyuki Inoue, Yawata, JP;
Toshio Kinoshita, Katano, JP;
Kazuo Ohuchi, Hojo, JP;
Masaru Ichihara, Ashiya, JP;
Shinji Yoshino, Nishinomiya, JP;
Hiroyuki Inoue, Yawata, JP;
Toshio Kinoshita, Katano, JP;
Kazuo Ohuchi, Hojo, JP;
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Abstract
The X-ray inspection device and the X-ray inspection method according to the present invention are configured to hold an object to be inspected irradiated with an X-ray from an X-ray irradiation device, uses a swinging device for performing swinging motion of tilting the object to be inspected at an arbitrary angle and in an arbitrary direction, images the X-ray that passes through the object to be inspected in an X-ray detection device and extracts data of a desired cross section from the X-ray image of the X-ray detection device in a control device.