Suita, Japan

Masanari Furiki

This inventor holds 2 USPTO granted patents and 2 published patent applications. Top assignees: Hitachi-High-Technologies Corporation, Hitachi-Science Systems, Ltd.. Active years: 2006-2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Masanari Furiki. Retrieved from https://idiyas.com/inventor/masanari-furiki

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 2 

% Patents Active = 50.0

Average Co-Inventor Count = 4.4

ph-index = 1

Forward Citations = 2(Granted Patents)


Location History:

  • Suita, JP (2006)
  • Tokyo, JP (2016)

Company Filing History:


Years Active: 2006-2016

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2 patents (USPTO):Explore Patents

Title: Masanari Furiki: Innovator in Charged Particle Beam Technology

Introduction

Masanari Furiki is a notable inventor based in Suita, Japan. He has made significant contributions to the field of charged particle beam technology, holding 2 patents that showcase his innovative approach to sample observation and defect marking.

Latest Patents

Furiki's latest patents include a charged particle beam apparatus and a sample observation method. The charged particle beam apparatus is designed to allow observation of a sample in a gas atmosphere or liquid state. This invention enables the observation of a dry sample as it becomes saturated with an introduced liquid while preventing the charged particle beam from scattering due to unwanted liquid. The structure includes an inlet-outlet part that facilitates the introduction of a desired liquid or gas, ensuring that the sample is irradiated with a primary charged particle beam without contact with the diaphragm.

The second patent focuses on efficiently transmitting position information of defects identified by a circuit pattern inspection apparatus. This is achieved through a marking technique that utilizes a charged particle beam irradiation mechanism. The marking allows for the sharing of defect position information with other apparatuses, improving analysis accuracy and reducing analysis time.

Career Highlights

Furiki has worked with prominent companies such as Hitachi High-Technologies Corporation and Hitachi Science Systems, Ltd. His experience in these organizations has contributed to his expertise in charged particle beam technology and its applications.

Collaborations

Throughout his career, Furiki has collaborated with notable colleagues, including Kouichi Kurosawa and Takehiko Konno. These collaborations have likely enriched his work and led to advancements in the field.

Conclusion

Masanari Furiki's contributions to charged particle beam technology demonstrate his innovative spirit and dedication to improving scientific methods. His patents reflect a commitment to enhancing observation techniques and defect analysis, marking him as a significant figure in his field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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