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For the Inventor, By the Inventor

Chino, Japan

Masakuni Shiozawa

USPTO Granted Patents = 15 

Average Co-Inventor Count = 1.3

ph-index = 3

Forward Citations = 42(Granted Patents)


Location History:

  • Sakata, JP (2002 - 2008)
  • Suwa, JP (2003 - 2008)
  • Chino, JP (2006 - 2013)
  • Nagano, JP (2014)

Company Filing History:

goldMedal15 out of 33,404 
 
Seiko Epson Corporation
 patents

Years Active: 2002-2014

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15 patents (USPTO):Explore Patents
1. 8816709 - Electronic component testing device and electronic component transport method (2014-08-26),
2. 8558570 - Component test apparatus and component transport method (2013-10-15),
3. 8008939 - Component test apparatus and component transport method (2011-08-30),
4. 7888928 - Component test apparatus having a pair of rotary transport hands (2011-02-15),
5. 7562806 - Apparatus for manufacturing electronic device, method of manufacturing electronic device, and program for manufacturing electronic device (2009-07-21),
6. 7410826 - Apparatus for manufacturing an electronic device, method of manufacturing an electronic device, and program for manufacturing an electronic device (2008-08-12),
7. 7371607 - Method of manufacturing semiconductor device and method of manufacturing electronic device (2008-05-13),
8. 7256072 - Semiconductor device, electronic device, electronic apparatus, and method of manufacturing semiconductor device (2007-08-14),
9. 7195935 - Selective packaging of tested semiconductor devices (2007-03-27),
10. 7017636 - Apparatus for manufacturing an electronic device, method of manufacturing an electronic device, and program for manufacturing an electronic device (2006-03-28),
11. 6984125 - Apparatus for manufacturing electronic device, method of manufacturing electronic device, and program for manufacturing electronic device (2006-01-10),
12. 6638785 - Adsorbing device, sucker and mounting device for conductive member, adsorbing method and mounting method for conductive member, and semiconductor device and method of making (2003-10-28),
13. 6566763 - Interconnect substrate, apparatus of applying adhesive material, semiconductor device, circuit board and electronic instrument (2003-05-20),
14. 6512294 - Adsorbing device, sucker and mounting device for conductive member, adsorbing method and mounting method for conductive member, and semiconductor device and method of making the same (2003-01-28),
15. 6391686 - Adhesive material applying method and apparatus, interconnect substrate, semiconductor device and manufacturing method thereof, circuit board and electronic instrument (2002-05-21),

Title: Innovations of Masakuni Shiozawa: A Pioneer in Electronic Component Testing

Introduction: Masakuni Shiozawa, based in Chino, Japan, is a remarkable inventor known for his contributions to the field of electronic component testing. With a significant portfolio of 15 patents, Shiozawa has established himself as an influential figure in the technology sector.

Latest Patents: Among his latest innovations, Masakuni Shiozawa has developed an electronic component testing device and an electronic component transport method. The electronic component testing device features multiple imaging devices that work in tandem to ensure precise positioning and orientation of electronic components during testing. This innovation enhances the reliability of tests conducted on various components.

The electronic component transport apparatus also represents a significant leap in efficiency. This transport system consists of a hand featuring multiple index units capable of holding components, along with a movable body that accurately transports these components to functional stations. Each index unit operates in synchronization with functional stations, facilitating an effective and smooth workflow.

Career Highlights: Shiozawa has made substantial contributions to his field while working at Seiko Epson Corporation. His commitment to advancing electronic testing technologies has garnered respect and recognition in the industry. His work has not only enhanced the efficiency of testing systems but has also paved the way for new methodologies in electronic component management.

Collaborations: Throughout his career, Masakuni Shiozawa has collaborated with fellow innovators Hiroaki Fujimori and Tomoyuki Shindo. Together, they have leveraged their expertise to push the boundaries of technology and achieve notable advancements in electronic component testing.

Conclusion: Masakuni Shiozawa stands out as a pioneering inventor whose work significantly impacts electronic testing technologies. With his continual innovations and collaborations, he plays a vital role in shaping the future of electronics. His contributions to Seiko Epson Corporation and the broader electronics industry highlight his vital presence in the realm of innovation.

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