Ehime, Japan

Masahumi Mori

This inventor holds 1 USPTO granted patent. Top assignee: Sumitomo Eaton Nova Corporation. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Masahumi Mori. Retrieved from https://idiyas.com/inventor/masahumi-mori

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: The Innovations of Masahumi Mori

Introduction

Masahumi Mori is a notable inventor based in Ehime, Japan. He has made significant contributions to the field of technology, particularly with his innovative designs and patents. His work focuses on enhancing the efficiency and effectiveness of various devices.

Latest Patents

One of Masahumi Mori's key inventions is a wafer scanning device. This device operates in a vacuum area and includes a holder to secure the wafer, a ball screw to facilitate movement, and a motor to drive the ball screw. The design features a transmission mechanism that is offset from the line of travel of the ball screw and motor, which are installed in the atmosphere. This configuration improves responsiveness regarding scanning speed control, enhances the uniformity of the scanning speed, and achieves optimal tilt for the wafer. Masahumi Mori holds 1 patent for this innovative device.

Career Highlights

Masahumi Mori is associated with Sumitomo Eaton Nova Corporation, where he continues to develop and refine his inventions. His work at the company has allowed him to collaborate with other experts in the field, further advancing technology in wafer scanning and related areas.

Conclusion

Masahumi Mori's contributions to the field of technology, particularly through his wafer scanning device, demonstrate his innovative spirit and dedication to improving device functionality. His work continues to influence advancements in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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