Masaaki Ishizaka

Title: Inventor Masaaki Ishizaka: Pioneering Innovations in Probe Card Technology

Introduction

Masaaki Ishizaka, an accomplished inventor based in Yokohama, Japan, has made significant contributions to the field of semiconductor testing technologies. With a total of four patents to his name, Ishizaka's innovative solutions have transformed the efficiency of probe cards used in wafer testing.

Latest Patents

Ishizaka's latest patents include the "Membrane sheet with bumps for probe card" and "Probe card and method for manufacturing membrane sheet with bumps for probe card." These inventions focus on improving the contact stability and efficiency of probe cards during wafer testing procedures. The probe card is designed to ensure stable contact with the electrode pads of a wafer under minimal pressure, which is critical for accurate testing outcomes.

The probe card comprises a frame plate equipped with multiple through-holes aligned with semiconductor chips on a wafer. It incorporates a wiring substrate, an anisotropic conductive membrane fixed in the through-holes, and a contact membrane. Notably, the contact membrane features an insulating layer with a conductive electrode and a bump, the latter formed by plating techniques. This unique structure allows for precise electrical connections via a conductive path in the anisotropic conductive membrane.

Another innovation involves a probe apparatus tailored for wafer-level burn-in screening, which integrates an elastic member, wiring substrate, and a series of bumps, all designed to enhance the reliability of the testing process.

Career Highlights

Masaaki Ishizaka has had a remarkable career, working for notable companies such as Matsushita Electric Industrial Co., Ltd. and Matsushita Electrical Industrial Co., Ltd. His work in these organizations has played a vital role in shaping the technology behind semiconductor testing.

Collaborations

Throughout his career, Ishizaka has collaborated with esteemed colleagues, including Yumio Nakamura and Yoshiro Nakata. Their collective efforts have contributed to advancing technologies in the semiconductor industry, particularly in the realm of probe card systems.

Conclusion

In summary, Masaaki Ishizaka stands out as a key figure in the innovation of probe card technologies. His four patents not only demonstrate his ingenuity but also show his commitment to enhancing semiconductor testing processes. As the industry continues to evolve, Ishizaka's contributions will undoubtedly influence future advancements in this critical area of technology.