Brno, Czechia

Martin Oral

This inventor holds 1 USPTO granted patent. Top assignee: Fei Comapny. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Martin Oral. Retrieved from https://idiyas.com/inventor/martin-oral

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Martin Oral and Magnetic Lens Innovation

Introduction

Martin Oral is an inventor associated with Brno, Czech Republic, and Fei Company. His patent work concerns magnetic lenses and charged-particle microscopy.

Latest Patents

Oral is associated with one patent, 1 patent, titled “Magnetic Lenses, Charged Particle Microscope Systems Including the Same, and Associated Methods.” The invention describes a magnetic lens that directs a charged-particle beam toward a sample location using multiple pole pieces and at least two independent coils. It can operate as an objective lens with a variable main objective plane, allowing magnification at the focal plane to be adjusted without immersing the sample in the magnetic fields produced by the coils.

The patent also describes a charged-particle microscope system comprising a charged-particle source, a sample holder, and a magnetic objective lens. Its associated method involves positioning a sample relative to the lens and operating the lens to focus the beam at a selected location.

Career Highlights

Oral’s listed patent reflects work on magnetic lens design and charged-particle microscope systems. The described approach focuses on controlling beam magnification and the objective plane while keeping the sample outside the coils’ magnetic fields.

Collaborations

Oral is listed as a coworker of Tomáš Radlička. The supplied information also associates him with Fei Company.

Conclusion

Martin Oral’s patent work centers on magnetic lenses for charged-particle microscopy, with an emphasis on adjustable focusing and magnification without immersing the sample in the coils’ magnetic fields.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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