Koenigsbronn, Germany

Martin Hugelmann

This inventor holds 1 USPTO granted patent. Top assignee: Carl Zeiss Microscopy Gmbh. Active years: 2014.


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Martin Hugelmann: Innovator in High-Voltage Technology

Introduction

Martin Hugelmann is a notable inventor based in Koenigsbronn, Germany. He has made significant contributions to the field of high-voltage technology, particularly in the development of equipment used in particle beam devices. His innovative approach has led to the creation of a patent that enhances the functionality and safety of high-voltage systems.

Latest Patents

Hugelmann holds a patent for a "High-voltage supply unit for a particle beam device." This invention includes a high-voltage supply unit that features at least one high-voltage cable for feeding high voltage, along with a measuring device designed to monitor the high voltage. The measuring device incorporates at least one first capacitor, which is formed by a section of the high-voltage cable itself. This design improves the efficiency and reliability of particle beam devices.

Career Highlights

Martin Hugelmann is currently employed at Carl Zeiss Microscopy GmbH, a leading company in the field of optical and electron microscopy. His work at this esteemed organization has allowed him to collaborate with other talented professionals and contribute to groundbreaking advancements in microscopy technology.

Collaborations

One of Hugelmann's notable coworkers is Joerg Fober. Their collaboration has likely fostered an environment of innovation and creativity, leading to further advancements in their respective fields.

Conclusion

Martin Hugelmann's contributions to high-voltage technology and his patent for a high-voltage supply unit demonstrate his commitment to innovation in the field. His work at Carl Zeiss Microscopy GmbH continues to influence advancements in particle beam devices and microscopy technology.

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