Trier, Germany

Martin Boguslawski

This inventor holds 2 USPTO granted patents. Top assignee: Iee International Electronics and Engineering S.a.. Active years: 2022-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Martin Boguslawski. Retrieved from https://idiyas.com/inventor/martin-boguslawski

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.4

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2022-2025

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2 patents (USPTO):Explore Patents

Title: Martin Boguslawski: Innovator in Depth Measurement Technology

Introduction

Martin Boguslawski is a notable inventor based in Trier, Germany. He has made significant contributions to the field of depth measurement technology, particularly through his innovative patent.

Latest Patents

Boguslawski holds a patent for a "Method for corrected depth measurement with a time-of-flight camera using amplitude-modulated continuous light." This method aims to enhance the accuracy and efficiency of depth measurements by correcting systematic errors in raw depth values. The process involves acquiring a raw depth value for each pixel in the camera's sensor array and calculating a ground truth value to ensure precision.

Career Highlights

He is currently associated with IEE International Electronics and Engineering S.A., where he applies his expertise in developing advanced measurement technologies. His work has been instrumental in improving the functionality of time-of-flight cameras.

Collaborations

Throughout his career, Boguslawski has collaborated with esteemed colleagues, including Bruno Mirbach and Harald Clos. These partnerships have fostered innovation and contributed to the advancement of technology in their field.

Conclusion

Martin Boguslawski's contributions to depth measurement technology exemplify his commitment to innovation. His patent reflects a significant advancement in the accuracy of time-of-flight cameras, showcasing his role as a leading inventor in this domain.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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