The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 30, 2025
Filed:
Feb. 14, 2020
Method for depth measurement with a time-of-flight camera using amplitude-modulated continuous light
Iee International Electronics & Engineering S.a., Echternach, LU;
IEE INTERNATIONAL ELECTRONICS & ENGINEERING S.A., Echternach, LU;
Abstract
A method for depth measurement with a time-of-flight camera using amplitude-modulated continuous light by acquiring for each of a plurality of pixels of a sensor array of the camera at least one sample sequence having at least four amplitude samples (A, A, A, A) at a sampling frequency higher than a modulation frequency of the amplitude-modulated continuous light. The method further includes: determining for each sample sequence of each pixel a confidence value (C) indicating a degree of correspondence of the amplitude samples (A, A, A, A) with a sinusoidal time evolution of the amplitude; and determining for each of a plurality of binning areas, each of which comprises a plurality of pixels, a binned depth value (D) based on the amplitude samples (A, A, A, A) of sample sequence of pixels from the binning area, wherein the contribution of a sample sequence to the binned depth value (D) depends on its confidence value (C).