The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2022

Filed:

Dec. 03, 2019
Applicant:

Iee International Electronics & Engineering S.a., Echternach, LU;

Inventors:

Bruno Mirbach, Konz, DE;

Harald Clos, SaarbrĂĽcken, DE;

Martin Boguslawski, Trier, DE;

Thomas Solignac, Luttange, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/521 (2017.01); G06T 7/80 (2017.01); G01S 17/894 (2020.01); G01S 7/491 (2020.01);
U.S. Cl.
CPC ...
G06T 7/521 (2017.01); G01S 7/491 (2013.01); G01S 17/894 (2020.01); G06T 7/80 (2017.01); G06T 2207/10028 (2013.01);
Abstract

A method for corrected depth measurement with a time-of-flight camera using amplitude-modulated continuous light. In order to enable an accurate and efficient depth measurement with a time-of-flight camera, the method includes, for each of a plurality of pixels of a sensor array of the camera: acquiring with the camera a raw depth value rfor the pixel; and automatically calculating a ground truth value raccording to: r=g(r−c)+c, to correct a systematic depth error of the raw depth value r, wherein cis a pixel-dependent first offset, g is a pixel-independent first function and cis a pixel-independent second offset.


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