Aachen, Germany

Markus Wedler

This inventor holds 1 USPTO granted patent. Top assignee: Synopsys, Inc.. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Markus Wedler. Retrieved from https://idiyas.com/inventor/markus-wedler

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Innovations of Markus Wedler

Introduction

Markus Wedler is a notable inventor based in Aachen, Germany. He has made significant contributions to the field of hybrid emulation systems. His work focuses on enhancing the efficiency and effectiveness of design testing processes.

Latest Patents

Markus Wedler holds a patent for "Emulated register access in hybrid emulation." This patent describes a hybrid emulation system designed for the emulation of a design under test (DUT). The system includes a hardware emulation component that emulates a first portion of the DUT, utilizing emulated registers. Additionally, it features a simulation system that simulates a second portion of the DUT. The hybrid emulation system is equipped with a configuration file that identifies a subset of the emulated registers, allowing for selective mirroring during the emulation process.

Career Highlights

Markus Wedler is currently employed at Synopsys, Inc., where he continues to innovate in the field of emulation technology. His work has been instrumental in advancing the capabilities of hybrid emulation systems.

Collaborations

Some of his notable coworkers include Alexandru Fiodorov and Sylvain Bayon De Noyer. Their collaborative efforts contribute to the ongoing development of cutting-edge technologies in the industry.

Conclusion

Markus Wedler's contributions to hybrid emulation systems exemplify the importance of innovation in technology. His patent and work at Synopsys, Inc. highlight his role as a key figure in advancing design testing methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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