Markus Heilig

Title: Innovations of Markus Heilig in Metrology

Introduction

Markus Heilig is an accomplished inventor based in Neuburg a. Inn, Germany. He has made significant contributions to the field of metrology, particularly with his innovative devices and methods. His work is characterized by a blend of optical and acoustic technologies, which enhance measurement accuracy.

Latest Patents

Markus Heilig holds a patent for a metrology device and method. This device includes a sound sample holder and an optical system designed to apply sound waves to a substrate stack surface. The optical system consists of a source, a lens field, a beam splitter, and a detector. The source outputs electromagnetic radiation, which is divided into multiple beam paths. The lens field applies one of these paths to the measuring surface, while the beam splitter forms interference radiation from the combined paths. The detector is responsible for detecting this interference radiation, making the device a valuable tool in metrology.

Career Highlights

Heilig is associated with Ev Group E. Thallner GmbH, where he has been instrumental in developing advanced metrology solutions. His expertise in combining sound and optical technologies has positioned him as a key figure in his field. With a focus on innovation, he continues to push the boundaries of what is possible in metrology.

Collaborations

Some of Markus Heilig's notable coworkers include Martin Eibelhuber and Boris Povazay. Their collaborative efforts contribute to the advancement of metrology technologies and enhance the capabilities of their projects.

Conclusion

Markus Heilig's contributions to metrology through his innovative devices and methods demonstrate his commitment to advancing measurement technologies. His work not only reflects his expertise but also the collaborative spirit of his team at Ev Group E. Thallner GmbH.