Shoreline, WA, United States of America

Mark L Delany


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: The Innovations of Mark L Delany

Introduction

Mark L Delany is an accomplished inventor based in Shoreline, WA (US). He has made significant contributions to the field of precision measurement through his innovative methods. With a focus on enhancing measurement accuracy, Delany has developed a unique approach that addresses the challenges posed by motion velocity.

Latest Patents

Delany holds a patent for his invention titled "Symmetric Sampling." This invention provides a method of sampling precision measurement signals to achieve an accurate measurement position at a specific measurement time. The method ensures that measurement accuracy remains unaffected by the velocity of motion. It involves sampling each signal during a predetermined period, where signals from multiple sensors are sampled in a specific order and then averaged to produce a precision measurement.

Career Highlights

Delany's career is marked by his work at Mitutoyo Corporation, a leading company in precision measurement technology. His innovative contributions have helped advance the company's mission to provide high-quality measurement solutions. With one patent to his name, Delany has established himself as a key figure in the field of precision measurement.

Collaborations

Throughout his career, Delany has collaborated with notable colleagues, including Nils Ingvar Andermo and David Skurnik. These collaborations have fostered an environment of innovation and have contributed to the development of advanced measurement techniques.

Conclusion

Mark L Delany's work exemplifies the spirit of innovation in precision measurement. His patented method of symmetric sampling showcases his commitment to enhancing measurement accuracy, making a lasting impact in the field.

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