The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2001
Filed:
Mar. 16, 1999
Nils Ingvar Andermo, Kirkland, WA (US);
David Skurnik, Kirkland, WA (US);
Mark L. Delany, Shoreline, WA (US);
Mitutoyo Corporation, Kawasaki, JP;
Abstract
The invention provides a method of sampling precision measurement signals to achieve an accurate measurement position at a particular measurement time, such that the measurement accuracy is unaffected by the velocity of motion. The method involves sampling each signal during a predetermined sampling period such that a signal from one sensor is sampled first, a signal from a second sensor sampled second, etc., and then the signals are sampled in reverse order such that the first signal sampled is sampled last. These sampled signals are averaged and produce a precision measurement at a time measured at one-half of the sampling time. In addition, this method can be applied to the use of separate scale tracks where each scale track is alternately sampled, or alternatively, where one scale track is sampled in the middle of the sampling period of another scale track.