Osnabrueck, Germany

Marius Thiel


Average Co-Inventor Count = 1.2

ph-index = 2

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2019-2022

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3 patents (USPTO):Explore Patents

Title: Marius Thiel: Innovator in Terahertz Measurement Technology

Introduction

Marius Thiel is a prominent inventor based in Osnabrueck, Germany. He has made significant contributions to the field of terahertz measurement technology, holding a total of 3 patents. His work focuses on innovative methods and devices for measuring layer thickness and distances in various test objects.

Latest Patents

Thiel's latest patents include a terahertz measuring device and a terahertz measuring method for inspecting objects. The first invention relates to a terahertz measuring apparatus designed for runtime measurements, particularly for layer thickness and distance measurements. This apparatus comprises advanced features that enhance its measurement capabilities. The second patent details a method and apparatus for measuring layer thickness and distance, utilizing terahertz beams radiated from a transmission and reception unit. The method involves detecting terahertz radiation that has passed through and been reflected by the measurement object, allowing for precise evaluation of measurement signals to ascertain layer thickness based on propagation time differences.

Career Highlights

Marius Thiel is currently employed at Inoex GmbH, a company specializing in innovations and equipment for extrusion technology. His role at Inoex GmbH allows him to apply his expertise in terahertz measurement technology to practical applications in the industry.

Collaborations

Thiel collaborates with Ralph Klose, contributing to the advancement of terahertz measurement techniques and their applications in various fields.

Conclusion

Marius Thiel's innovative work in terahertz measurement technology showcases his dedication to advancing measurement methods and devices. His contributions are significant in enhancing the accuracy and efficiency of measurements in various applications.

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