The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 24, 2019
Filed:
Apr. 06, 2017
Inoex Gmbh Innovationen Und Ausruestungen Fuer Die Extrusionstechnik, Melle, DE;
Marius Thiel, Osnabrueck, DE;
Abstract
The invention relates to a terahertz measuring device () for measuring a test object (), comprising: a THz transmitter and receiver unit () for emitting terahertz radiation () at a spatial angle of emittance () along an optical axis (A), receiving reflected terahertz radiation () and generating a signal amplitude (S) as a function of the time or frequency (t, f), anda controller and evaluator device () for receiving and evaluating the signal amplitude (S). Hereby, the controller and evaluator device () determines defects () of the test object () from the signal amplitude (S). In particular, it is possible to mask a core area () of the emitted terahertz radiation (). An alternative measuring arrangement can reveal defects also by injecting the THz radiation at a right angle in that additional measuring peaks are detected which cannot be associated with the layer thickness measurement as such.