Company Filing History:
Years Active: 2024-2025
Title: Innovations by Mario Josephus De Bijl
Introduction
Mario Josephus De Bijl is a notable inventor based in Leidschendam, Netherlands. He has made significant contributions to the field of surveying technology, holding a total of 2 patents. His work focuses on innovative methods and systems for measuring locations on objects, which have practical applications in various surveying tasks.
Latest Patents
One of his latest patents is titled "Apparatus, method and system for measuring locations on an object." This system is designed to monitor survey reflectors arranged at multiple locations on an object. The processing unit within the system is configured to determine the locations of the survey reflectors from image sensor data. It can also detect movement of the survey reflectors by comparing the determined locations with previously established ones. Another significant patent is "Surveying instrument for and surveying method of surveying reference points." This invention involves a camera that monitors positions on an external object equipped with a beacon. The apparatus includes at least one image sensor and an imaging optical element that projects light onto the image sensor. The processing unit processes the image data to filter out background light, allowing for accurate rendering of the light beam data.
Career Highlights
Mario Josephus De Bijl is associated with FNV IP B.V., where he continues to develop and refine his innovative ideas. His work has contributed to advancements in surveying technology, enhancing the accuracy and efficiency of location measurement.
Collaborations
He has collaborated with notable coworkers such as Arnoud Marc Jongsma and Dennis Van Weeren, who have also contributed to the field of surveying and measurement technologies.
Conclusion
Mario Josephus De Bijl's contributions to surveying technology through his patents demonstrate his innovative spirit and commitment to advancing the field. His work continues to influence how locations are measured and monitored in various applications.