The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 15, 2025
Filed:
Feb. 18, 2021
Applicant:
Fnv Ip B.v., Leidschendam, NL;
Inventors:
Arnoud Marc Jongsma, Leidschendam, NL;
Dennis Van Weeren, Leidschendam, NL;
Mario Josephus De Bijl, Leidschendam, NL;
Assignee:
FNV IP B.V., Leidschendam, NL;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C 11/02 (2006.01); G06T 7/73 (2017.01); H04N 23/56 (2023.01);
U.S. Cl.
CPC ...
G01C 11/02 (2013.01); G06T 7/74 (2017.01); H04N 23/56 (2023.01);
Abstract
A system for monitoring survey reflectors arranged at a plurality of locations on an object, having: The processing unit is configured to determine locations of the survey reflectors from the image sensor data and detect movement of the survey reflectors based on a comparison of the determined locations with previously determined locations.