Vijfhuizen, Netherlands

Arnoud Marc Jongsma

This inventor holds 11 USPTO granted patents and 4 published patent applications, plus 3 CIPO patents and 9 EPO patents. Top assignees: Fnv IP B.v., Fugro N.v.. Active years: 2019-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Arnoud Marc Jongsma. Retrieved from https://idiyas.com/inventor/arnoud-marc-jongsma

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 11 

% Patents Active = 100.0

 

 

Average Co-Inventor Count = 2.3

ph-index = 1

Forward Citations = 4(Granted Patents)


Location History:

  • Leidschendam, NL (2019 - 2023)
  • Vijfhuizen, NL (2021 - 2024)

Company Filing History:


Years Active: 2019-2025

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11 patents (USPTO):Explore Patents

Title: Arnoud Marc Jongsma: Innovator in Mapping Technologies

Introduction

Arnoud Marc Jongsma is a notable inventor based in Vijfhuizen, Netherlands. He has made significant contributions to the field of mapping technologies, holding a total of 11 patents. His work focuses on innovative methods and systems that enhance the accuracy and efficiency of mapping regions and monitoring objects.

Latest Patents

One of his latest patents is a "Method and system for mapping a region." This invention involves a method for mapping a target region of space with signal scatterers. The process includes moving a signal transmitter and/or receiver along a trajectory relative to the target region while transmitting a probing signal. This probing signal consists of a time sequence of noise with a predefined bandwidth. The system receives a response signal composed of components resulting from the scattering of the probing signal by portions of the target region. The method also transforms the probing signal into multiple test signals, correlating each with the response signal to generate a map of correlation strength values associated with the target region.

Another significant patent is the "Apparatus, method and system for measuring locations on an object." This system is designed for monitoring survey reflectors arranged at various locations on an object. The processing unit determines the locations of the survey reflectors from image sensor data and detects their movement by comparing determined locations with previously established ones.

Career Highlights

Throughout his career, Arnoud has worked with reputable companies such as FNV IP B.V. and Fugro N.V. His experience in these organizations has contributed to his expertise in the field of mapping technologies and innovation.

Collaborations

Arnoud has collaborated with notable professionals in his field, including Dennis Van Weeren and Joachim Ulrich Seibert. These collaborations have likely enriched his work and contributed to the development of his innovative patents.

Conclusion

Arnoud Marc Jongsma is a distinguished inventor whose work in mapping technologies has led to significant advancements in the field. His innovative patents and collaborations reflect his commitment to enhancing the accuracy and efficiency of mapping systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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