Fnv IP B.v.

Mario Josephus De Bijl

Arnoud Marc Jongsma

Dennis Van Weeren

Joachim Ulrich Seibert

A system for monitoring survey reflectors arranged at a plurality of locations on an object, having: The processing unit is configured to determine locations of the survey reflectors from the image sensor data and detect movement of the survey reflectors based on a comparison of the determined locations with previously determined locations.

Apparatus, method and system for measuring locations on an object

A camera monitors positions on an external object having a beacon ((), i=, . . . , I;) attached to it. The apparatus has at least one image sensor (), an imaging optical element () for projecting light on the image sensor (), and a processing unit (). The imaging optical element () may be non-refractive and receives a light beam (();) transmitted from the beacon (();) and transfers the light beam (();) to the image sensor (). The image sensor () forms image data based on the received light beam (();) and background light. The processing unit () processes the image data such that it filters image data components relating to the background light and renders image data components relating to the light beam.

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Leidschendam, Netherlands

Mario Josephus De Bijl