This inventor holds 2 USPTO granted patents. Top assignees: Renesas Technology Corp., Other. Active years: 2003-2006.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
1 out of 3,781 
1 out of 834,601 Years Active: 2003-2006
Title: Mariko Mizuo: Innovator in Semiconductor Inspection Technology
Introduction
Mariko Mizuo is a prominent inventor based in Hyogo, Japan, known for her contributions to semiconductor inspection technology. With a total of 2 patents, she has made significant advancements in the field, particularly in the development of devices that enhance the accuracy and efficiency of semiconductor wafer inspections.
Latest Patents
Mizuo's latest patents include a device for inspecting defects on semiconductor wafer surfaces. This innovative inspection device utilizes an imaging device to obtain image data of the wafer being inspected. It features a storage circuit that holds reference image data, an image comparison unit that analyzes the images based on specific inspection conditions, and a WIP data operating unit that adjusts these conditions based on wafer in process data.
Another notable patent is for a semiconductor inspection system and a method for manufacturing semiconductor devices. This system is designed to inspect recessed defects in semiconductor wafers. It involves radiating a laser beam onto the wafer, detecting scattered light from foreign particles, converting this light into an electric signal, and outputting information about the recessed defects by subtracting data related to foreign particles from the overall data.
Career Highlights
Throughout her career, Mariko Mizuo has worked with notable companies, including Renesas Technology Corporation. Her work has significantly impacted the semiconductor industry, particularly in improving inspection methodologies.
Collaborations
Mizuo has collaborated with several professionals in her field, including Yoko Miyazaki and Toshiharu Katayama. These collaborations have contributed to her innovative approaches and advancements in semiconductor technology.
Conclusion
Mariko Mizuo's contributions to semiconductor inspection technology through her patents and collaborations highlight her role as a key innovator in the industry. Her work continues to influence the development of more efficient and accurate inspection systems for semiconductor manufacturing.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile