Manish Sharma

Title: Innovations by Manish Sharma

Introduction

Manish Sharma is an accomplished inventor based in Urbana, IL (US). He has made significant contributions to the field of integrated circuit testing, holding a total of 3 patents. His work focuses on improving methodologies for testing and analyzing integrated circuits, which is crucial for ensuring their reliability and performance.

Latest Patents

One of his latest patents is titled "Method for determining the impact on test coverage of scan chain parallelization by analysis of a test set for independently accessible flip-flops." This invention implements a scan test methodology that generates a test pattern set. A linear-time analysis is performed on this test pattern set, resulting in a new test pattern set. Comparisons are made between the original and new test pattern sets to analyze any differences in faults detected. If differences are found, test pattern generation is performed using the new test pattern set, augmenting it with the original set.

Another notable patent is the "Method and apparatus for deriving a bounded set of path delay test patterns covering all transition faults." This invention provides a method and apparatus for generating test patterns used to test integrated circuits. It includes logic for determining a subset of transition fault sites on an IC, identifying the longest sensitizable path through each site, and generating a bounded set of test patterns to test these paths. This innovation combines aspects of transition fault modeling and path delay fault modeling, enabling global delay testing of an IC efficiently.

Career Highlights

Manish Sharma has worked with prominent companies in the technology sector, including Agilent Technologies, Inc. and Avago Technologies General IP (Singapore) Pte. Ltd. His experience in these organizations has contributed to his expertise in integrated circuit testing and innovation.

Collaborations

Throughout his career, Manish has collaborated with notable professionals, including Jeff Rearick and Jeffrey R Rearick. These collaborations have likely enriched his work and contributed to the development of his patents.

Conclusion

Manish Sharma's contributions to the field of integrated circuit testing through his innovative patents demonstrate his expertise and commitment to advancing technology. His work continues to impact the industry positively, ensuring the reliability and performance of integrated circuits.