The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2006
Filed:
Mar. 28, 2003
Jeffrey R. Rearick, Fort Collins, CO (US);
Manish Sharma, Urbana, IL (US);
Jeffrey R. Rearick, Fort Collins, CO (US);
Manish Sharma, Urbana, IL (US);
Avago Technologies General IP(Singapore) Pte. Ltd., Singapore, SG;
Abstract
In one embodiment of the present invention, a scan test methodology is implemented which generates a test pattern set. A linear-time analysis is then performed on the test pattern set. As a result a new test pattern set is generated. Comparisons are made between the original test pattern set and the new test pattern set to analyze any difference in faults detected by the original test pattern set and the new test pattern set. If there are any differences in faults, test pattern generation is performed using the new test pattern set and the original test pattern set is used to augment the new test pattern set.