Milpitas, CA, United States of America

Manh Dang Nguyen

This inventor holds 2 USPTO granted patents. Top assignee: Kla Corporation. Active years: 2022-2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Manh Dang Nguyen. Retrieved from https://idiyas.com/inventor/manh-dang-nguyen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 14.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2022-2023

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2 patents (USPTO):Explore Patents

Title: Inventor Spotlight: Manh Dang Nguyen

Introduction

Manh Dang Nguyen, based in Milpitas, California, is an innovative inventor recognized for his contributions to the field of spectroscopic metrology. With a total of two patents to his name, Nguyen is making significant strides in enhancing measurement techniques that could impact various technological applications.

Latest Patents

Nguyen's latest patents revolve around sophisticated techniques for bandgap measurements of patterned film stacks using spectroscopic metrology. The patented system includes a spectroscopic metrology tool combined with a controller that generates a model of a multilayer grating composed of two or more layers. This model encompasses geometric parameters that indicate the geometry of a test layer and dispersion parameters that describe its dispersion characteristics. The controller analyzes the spectroscopic signal from a fabricated multilayer grating, allowing it to determine critical values of the modeled parameters. Ultimately, this system predicts the bandgap of the test layer based on these values, presented within a selected tolerance, thereby offering enhanced precision in the measurement processes.

Career Highlights

Nguyen is currently employed at Kla Corporation, a leading organization in the field of semiconductor inspection and metrology solutions. Through his work, he has played an integral role in advancing metrology systems, incorporating innovative approaches to optical measurement techniques and enhancing data reliability for various applications in manufacturing and technology.

Collaborations

Throughout his career, Nguyen has collaborated with notable colleagues, including Tianhan Wang and Aaron J Rosenberg. These partnerships have fostered an environment of shared knowledge and innovation, contributing to the development of advanced technologies in the field of spectroscopic metrology.

Conclusion

With a firm foothold in the realm of inventions, Manh Dang Nguyen continues to pave the way for future advancements in measurement and metrology systems. His work at Kla Corporation exemplifies the impact of innovative thinking, and his patents stand as testament to the significant contributions he is making to the industry. As technology progresses, Nguyen’s inventions promise to play a vital role in refining the techniques we use to measure and understand complex materials.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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