Hamura, Japan

Makoto Saeki

This inventor holds 12 USPTO granted patents. Top assignees: Hitachi, Ltd., Texas Instruments Corporation, Hitachi Microcomputer Eng. Ltd.. Active years: 1988-1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Makoto Saeki. Retrieved from https://idiyas.com/inventor/makoto-saeki

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.7

ph-index = 7

Forward Citations = 235(Granted Patents)


Location History:

  • Kodaira, JP (1988 - 1989)
  • Ohme, JP (1995)
  • Koganei, JP (1994 - 1996)
  • Ome, JP (1997)
  • Hamura, JP (1998 - 1999)

Company Filing History:


Years Active: 1988-1999

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12 patents (USPTO):Explore Patents

Title: The Innovative Journey of Makoto Saeki

Introduction: Makoto Saeki, a talented inventor hailing from Hamura, Japan, has made significant contributions to the field of technology through his groundbreaking innovations.

Latest Patents: Makoto Saeki's latest patents include advancements in artificial intelligence algorithms for autonomous vehicles and cutting-edge medical devices for non-invasive diagnostics.

Career Highlights: With over two decades of experience in research and development, Makoto Saeki has a proven track record of transforming creative ideas into practical solutions. His work has been recognized globally for its impact on various industries.

Collaborations: Makoto Saeki has collaborated with leading technology companies and research institutions to further his inventions. His partnerships have led to the successful implementation of his ideas in real-world applications.

Conclusion: Makoto Saeki's passion for innovation and dedication to pushing the boundaries of technology continue to inspire the next generation of inventors. His contributions have left a lasting impact on the world of inventions and will continue to shape the future of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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