This inventor holds 1 USPTO granted patent. Top assignee: Fei Comapny. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Magdalena Špoková: Inventor in Charged-Particle Microscopy.
Introduction
Magdalena Špoková is an inventor associated with Ostrava, Czechia. Her patent work concerns objective lenses and charged-particle microscopes.
Latest Patents
The available information lists one patent for Špoková: “Objective Lenses, Charged Particle Microscopes Including the Same, and Associated Methods.” The invention describes an objective lens with a lens body, shielding electrode, and steering electrode. Varying the steering-electrode voltage adjusts the location of the lens’s main objective plane and, in turn, its focal working distance. The disclosed methods also include positioning a sample relative to the lens and operating it to focus a charged-particle beam.
Career Highlights
Špoková is associated with FEI Company. Her listed patent reflects work on lens design and beam focusing for charged-particle microscopy. The supplied information identifies 1 patent.
Collaborations
The listed coworkers are Radovan Vašina and Bohuslav Sed’a. Their names are provided as collaborators, though specific roles or contributions are not stated.
Conclusion
Magdalena Špoková’s listed invention addresses adjustable objective-lens performance in charged-particle microscopes, with a focus on controlling working distance and beam focus.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile