Seoul, South Korea

Maeng Youl Lee

USPTO Granted Patents = 5 

Average Co-Inventor Count = 2.4

ph-index = 2

Forward Citations = 11(Granted Patents)


Location History:

  • Yangcheon-gu, KR (2013)
  • Seoul, KR (2011 - 2018)

Company Filing History:


Years Active: 2011-2018

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5 patents (USPTO):Explore Patents

Title: Maeng Youl Lee: Innovator in Calibration Technology

Introduction

Maeng Youl Lee is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of calibration technology, holding a total of 5 patents. His work focuses on enhancing the accuracy and efficiency of network analyzers and semiconductor inspection processes.

Latest Patents

One of his latest patents is a calibration apparatus and method for network analyzers. This invention includes a communication portion that interacts with the network analyzer to facilitate data input and output necessary for calibration. It features a signal input portion that receives a signal indicating the start of calibration, along with at least one radio frequency (RF) port for connection to the network analyzer. Additionally, the apparatus includes an adaptor to connect the RF port with the network analyzer, an impedance circuit portion with standard impedance, and a controller that generates calibration data using various characteristic data.

Another notable patent is a probe block designed for inspecting semiconductor chips. This probe block comprises a probe with first and second contact portions connected by beams, along with a guide that supports the probe. The probe block is intended for installation in a probe card, enhancing the inspection process of semiconductor chips.

Career Highlights

Maeng Youl Lee has worked with several companies, including Gigalane Co., Ltd. and Withwave Co., Ltd. His experience in these organizations has allowed him to develop innovative solutions that address complex challenges in calibration and semiconductor technology.

Collaborations

Throughout his career, Maeng Youl Lee has collaborated with notable colleagues, including Yong Goo Lee and Min Su Park. These partnerships have contributed to the advancement of his inventions and the overall progress in the field.

Conclusion

Maeng Youl Lee's contributions to calibration technology and semiconductor inspection are noteworthy. His innovative patents and collaborative efforts reflect his commitment to advancing technology in these critical areas.

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